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ECN publicatie:
Impact of common metallurgical impurities on mc-Si solar cell efficiency: p-type versus n-type doped ingots
Geerligs, L.J.; Manshanden, P.; Solheim, I.; Ovrelid, E.J.; Waernes, A.N.
Gepubliceerd door: Publicatie datum:
ECN Zonne-energie 11-9-2006
ECN publicatienummer: Publicatie type:
ECN-RX--06-020 Conferentiebijdrage
Aantal pagina's: Volledige tekst:
4 Download PDF  (212kB)

Gepresenteerd op: 21st European Photovoltaic Solar Energy Conference and Exhibition, Dresden, Germany, 4-8 september 2006.

Silicon solar cells based on n-type silicon wafers are less sensitive to carrier lifetime degradation due to several common metal impurities than p-base cells. The theoretical and experimental indications for this have recently received considerable attention. This paper compares p-type and n-type cells purposely contaminated with relatively high levels of impurities, processed by industrial techniques. The impurities considered are Al, Ti, and Fe, which are the dominant impurities in metallurgical silicon and natural quartz. The work also preliminary addresses the question whether the optimal wafer resistivity is the same for n-type as for p-type base mc-Si cells.

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