ECN publicatie:
Wafer Thickness, Texture and Performance of Multicrystalline Silicon Solar Cells
Gepubliceerd door: Publicatie datum:
ECN Zonne-energie 1-1-2004
ECN publicatienummer: Publicatie type:
ECN-RX--04-030 Conferentiebijdrage
Aantal pagina's: Volledige tekst:
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Gepresenteerd op: 14th International Photovoltaic Science and Engineering Conference ( PVSEC), Bangkok, Thailand, 26-30 januari 2004.


The influence of wafer thickness and surface texturing of silicon solar cells on cell results has been investigated using neighbouring multicrystalline silicon wafers with thickness ranging from 150 µm to 350 µm and isotropic NaOH or acid etched. It was found experimentally that Voc decreases nearly 1.5% and Jsc decreases nearly 3 %, resulting in a 4 % relative decrease in efficiency, in halving the wafer thickness. These trends are independent of the front surface texturing.

Front surface texturing, however, results in a 6 % increase of Jsc and a nearly 6 % increase in efficiency independent of the wafer thickness.

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