Publicaties

Skip Navigation Links.
Recent verschenen
Expand per documenttypeper documenttype
Collapse per Unitper Unit
Expand Business DevelopmentBusiness Development
Expand Biomass & Energy EfficiencyBiomass & Energy Efficiency
Expand BeleidsstudiesBeleidsstudies
Expand Corporate CommunicationsCorporate Communications
Expand CorporateCorporate
Expand Environment & Energy EngineeringEnvironment & Energy Engineering
Expand Program DevelopmentProgram Development
Expand Quality Safety Health and EnvironmentQuality Safety Health and Environment
Expand Strategy & PlanningStrategy & Planning
Expand WindenergieWindenergie
Collapse Zonne-energieZonne-energie
2018
2017
2016
2015
2014
2013
2012
2011
2010
2009
2008
2007
2006
2005
2004
2003
2002
2001
2000
1999
1998
1997
Expand per Clusterper Cluster

Zoeken naar publicaties:
Beperk het zoeken tot de velden:

ECN publicatie:
Titel:
Fitting flash test curves with ECN's I-V curve fitting program IVFIT
 
Auteur(s):
Burgers, A.R.
 
Gepubliceerd door: Publicatie datum:
ECN Zonne-energie 1-1-2004
 
ECN publicatienummer: Publicatie type:
ECN-RX--04-007 Conferentiebijdrage
 
Aantal pagina's: Volledige tekst:
2 Download PDF  (62kB)

Gepresenteerd op: 14th International Photovoltaic Science and Engineering Conference ( PVSEC), Bangkok, Thailand, 26-30 januari 2004.

Samenvatting:
A procedure is discussed to do fitting of one- and two diode modelsto I-V curves measured at varying irradiance. An example of such a measurement is a flash test measurement. The procedure is compared to the translation procedure as described in IEC standard 891. This procedure has a draw backs that an estimate for the series resistance is required and that the translation introduces deviations from the diode curve model.


Terug naar overzicht.