ECN publicatie:
Fitting flash test curves with ECN's I-V curve fitting program IVFIT
Gepubliceerd door: Publicatie datum:
ECN Zonne-energie 1-1-2004
ECN publicatienummer: Publicatie type:
ECN-RX--04-007 Conferentiebijdrage
Aantal pagina's: Volledige tekst:
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Gepresenteerd op: 14th International Photovoltaic Science and Engineering Conference ( PVSEC), Bangkok, Thailand, 26-30 januari 2004.

A procedure is discussed to do fitting of one- and two diode modelsto I-V curves measured at varying irradiance. An example of such a measurement is a flash test measurement. The procedure is compared to the translation procedure as described in IEC standard 891. This procedure has a draw backs that an estimate for the series resistance is required and that the translation introduces deviations from the diode curve model.

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