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Titel:
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Error diagnosis and optimisation of C-Si solar cell processing using contact resistances determined with the Corescanner
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Auteur(s):
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Gepubliceerd door:
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Publicatie datum:
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ECN
Zonne-energie
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1-10-2002
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ECN publicatienummer:
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Publicatie type:
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ECN-RX--02-054
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Artikel wetenschap tijdschrift
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Aantal pagina's:
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7
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Gepubliceerd in: Solar Energy Materials & Solar Cells (Elsevier), , 2002, Vol.43, p.43-.
Samenvatting:
The screen printing metallisation process used for 90% of industriallyproduced solar cells is sensitive to process conditions. The best way
to monitor this contacting process is to measure contact resistance.
The standard technique used is the Transmission Line Method (TLM). However,
this only measures contact resistance locally.
In this paper, contact resistance over the whole cell surface is measured
with the newly developed ?Corescanner?. Using this instrument, the relation
between processing parameters and solar cell contact resistance distribution
is investigated. Our most important finding is that poor contacting
results in large inhomogeneities in contact resistance. Even for cells
with very low fill factors, regions of low contact resistance can be
found.
To conclude, the Corescanner provides us with a technique to monitor
contact resistance. This instrument is an invaluable tool for fault
detection, error diagnosis and process optimisation.
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