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ECN publicatie:
Titel:
Investigation of series resistance losses by illuminated lock-in thermography
 
Auteur(s):
Isenberg, J.; Warta, W.; Heide, A.S.H. van der
 
Gepubliceerd door: Publicatie datum:
ECN Zonne-energie 1-10-2000
 
ECN publicatienummer: Publicatie type:
ECN-RX--05-032 Artikel wetenschap tijdschrift
 
Aantal pagina's:
7  

Gepubliceerd in: Progress in Photovoltaics: Research and Applications (John Wiley & Sons Ltd.), , 2005, Vol.13, p.697-703.

Samenvatting:

A measurement mode (JSC-ILIT) for the recently introduced Illuminated Lock-In Thermography (ILIT) method and a new interpretation of the images obtained is proposed. This mode is especially adapted for the investigation of series resistance, in particular contact resistance, in solar cells. Comparison of JSC-ILIT results to emitter potential maps obtained by Corescan demonstrate good agreement between the poorly contacted areas, proving the practical applicability of the technique. JSC-ILIT provides a quasi-contactless and fast measurement. Comparison is made with the recently introduced method of RS-ILIT. The capability of both methods to detect series resistance problems is demonstrated. Possible distortions due to inhomogeneities of bulk material quality are discussed.


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