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Titel:
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A comparative study between light-biased MW-PCD and MFCA measurements on high-quality surface passivated silicon wafers
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Auteur(s):
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Gepubliceerd door:
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Publicatie datum:
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ECN
Zonne-energie
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1997
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ECN publicatienummer:
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Publicatie type:
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ECN-RX--97-028
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Artikel wetenschap tijdschrift
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Aantal pagina's:
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6
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Gepubliceerd in: Paper, presented at the 14th European photovoltaic solar energy conference and exhibition, 30 June - 4 July 1997, Barcelona, Spa (), , , Vol., p.-.
Samenvatting:
In this paper, the microwave-detected photoconductance decay (MW-PCD)technique is compared with the modulated free carrier absorption (MFCA)
technique by measuring the effective lifetime (eff) of minority carriers in
thermally oxidized high-quality FZ p-Si wafers as a function of the bias
light induced bulk injection level (n). An excellent agreement between both
systems is obtained, provided that differences in the spectral distribution
of the bias light are properly accounted for. We demonstrate that both
techniques are complementary to one another with respect to the bias light
intensity range. This allows the measurement of eff as a function of the
injection level over 4-5 orders in magnitude. Furthermore, eff is evaluated
using an iterative calculation procedure based on the differential surface
recombination velocity concept. 4 figs., 16 refs.
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