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Titel:
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Application of X-ray computed tomography in silicon solar cells
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Auteur(s):
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Popovich, V.A.; Verwaal, W.; Janssen, M.; Bennett, I.J.; Richardson, I.M.
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Gepubliceerd door:
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Publicatie datum:
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ECN
Zonne-energie
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6-9-2010
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ECN publicatienummer:
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Publicatie type:
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ECN-M--10-031
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Conferentiebijdrage
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Aantal pagina's:
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Volledige tekst:
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6
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Download PDF
(1433kB)
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Gepresenteerd op: 25th European Photovoltaic Solar Energy Conference and Exhibition - 5th World Conference on Photovoltaic Energy Conversion, Valencia, Spain, 6-10 september 2010.
Samenvatting:
The present study outlines the characterization of the internal microstructure in a multi-crystalline silicon solar cell, by means of a powerful non-intrusive experimental method, namely X-ray computed tomography. The pur-pose of this research is to give a better under-standing of the silicon solar cells metallization layers and defects related to its processing. Resulting tomographic images showed the distribution of bismuth glass and porosity in Al and Ag contact layers. At the same time, 3D tomographic images revealed the presence of process induced defects.
In this work the usefulness of the CT tech-nique for the in depth study of silicon solar cells is shown.
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