ECN publicatie:
Shunt detection in solar cells with the Corescanner and lock-in thermography : a comparison
Heide, A.S.H. van der; Breitenstein, O.; Rakotoniaina, J.P.
Gepubliceerd door: Publicatie datum:
ECN Zonne-energie 1-8-2001
ECN publicatienummer: Publicatie type:
ECN-RX--01-048 Conferentiebijdrage
Aantal pagina's: Volledige tekst:
4 Download PDF  (657kB)

Gepresenteerd op: 11th Workshop on Crystalline Silicon Solar Cell Materials and Processes, Ester Park CO, USA, 19-22 augustus 2001.

The Corescanner has been recently introduced as a simple and cheap instrument to map COntact REsistance of the front side metallisation. Additionally, the Corescanner may be used to localize shunts according to the Parallel Resistance Analysis by Mapping of Potential method (PRAMP). Until now shunts have been imaged most clearly using infrared (IR) lock-in thermography, which is quite an expensive technique. In this contribution PRAMP and lock-in thermography are directly compared by investigating an identical sample. It turned out that the sensitivity of PRAMP is not as high as that of lock-in thermography, and PRAMP cannot detect shunts below metallisation, in contrary to lock-in thermography. These conclusions show that the Corescanner is suited for solving most processing problems causing strong local shunts, whereas the lock-in thermography is best for a complete determination of all shunts.

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