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ECN publicatie:
A comparative study between light-biased MW-PCD and MFCA measurements on high-quality surface passivated silicon wafers
Schuurmans, F.M.; Sinke, W.C.; Schmidt, J.; Aberle, A.G.
Gepubliceerd door: Publicatie datum:
ECN Zonne-energie 1997
ECN publicatienummer: Publicatie type:
ECN-RX--97-028 Artikel wetenschap tijdschrift
Aantal pagina's:

Gepubliceerd in: Paper, presented at the 14th European photovoltaic solar energy conference and exhibition, 30 June - 4 July 1997, Barcelona, Spa (), , , Vol., p.-.

In this paper, the microwave-detected photoconductance decay (MW-PCD)technique is compared with the modulated free carrier absorption (MFCA) technique by measuring the effective lifetime (eff) of minority carriers in thermally oxidized high-quality FZ p-Si wafers as a function of the bias light induced bulk injection level (n). An excellent agreement between both systems is obtained, provided that differences in the spectral distribution of the bias light are properly accounted for. We demonstrate that both techniques are complementary to one another with respect to the bias light intensity range. This allows the measurement of eff as a function of the injection level over 4-5 orders in magnitude. Furthermore, eff is evaluated using an iterative calculation procedure based on the differential surface recombination velocity concept. 4 figs., 16 refs.

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