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Titel:
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Investigation of series resistance losses by illuminated lock-in thermography
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Auteur(s):
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Gepubliceerd door:
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Publicatie datum:
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ECN
Zonne-energie
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1-10-2000
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ECN publicatienummer:
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Publicatie type:
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ECN-RX--05-032
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Artikel wetenschap tijdschrift
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Aantal pagina's:
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7
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Gepubliceerd in: Progress in Photovoltaics: Research and Applications (John Wiley & Sons Ltd.), , 2005, Vol.13, p.697-703.
Samenvatting:
A measurement mode (J
SC-ILIT) for the recently introduced
Illuminated Lock-In Thermography (ILIT) method and a new interpretation
of the images obtained is proposed. This mode is especially adapted
for the investigation of series resistance, in particular contact resistance,
in solar cells. Comparison of JSC-ILIT
results to emitter potential maps obtained by Corescan demonstrate good
agreement between the poorly contacted areas, proving the practical
applicability of the technique. JSC-ILIT
provides a quasi-contactless and fast measurement. Comparison is made
with the recently introduced method of RS-ILIT. The capability of both methods to detect series
resistance problems is demonstrated. Possible distortions due to inhomogeneities
of bulk material quality are discussed.
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