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Titel:
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Wafer Thickness, Texture and Performance of Multicrystalline Silicon Solar Cells
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Auteur(s):
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Gepubliceerd door:
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Publicatie datum:
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ECN
Zonne-energie
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1-1-2004
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ECN publicatienummer:
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Publicatie type:
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ECN-RX--04-030
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Conferentiebijdrage
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Aantal pagina's:
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Volledige tekst:
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8
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Download PDF
(104kB)
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Gepresenteerd op: 14th International Photovoltaic Science and Engineering Conference ( PVSEC), Bangkok, Thailand, 26-30 januari 2004.
Samenvatting:
The influence of wafer thickness and surface texturing of silicon
solar cells on cell results has been investigated using neighbouring
multicrystalline silicon wafers with thickness ranging from 150 µm to
350 µm and isotropic NaOH or acid etched. It was found experimentally
that Voc decreases nearly 1.5% and Jsc decreases
nearly 3 %, resulting in a 4 % relative decrease in efficiency, in halving
the wafer thickness. These trends are independent of the front surface
texturing.
Front surface texturing, however, results in a 6 % increase of
Jsc and a nearly 6 % increase in efficiency independent of
the wafer thickness.
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