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Titel:
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Fitting flash test curves with ECN's I-V curve fitting program IVFIT
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Auteur(s):
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Gepubliceerd door:
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Publicatie datum:
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ECN
Zonne-energie
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1-1-2004
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ECN publicatienummer:
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Publicatie type:
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ECN-RX--04-007
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Conferentiebijdrage
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Aantal pagina's:
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Volledige tekst:
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2
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Download PDF
(62kB)
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Gepresenteerd op: 14th International Photovoltaic Science and Engineering Conference ( PVSEC), Bangkok, Thailand, 26-30 januari 2004.
Samenvatting:
A procedure is discussed to do fitting of one- and two diode modelsto I-V curves measured at varying irradiance. An example of such a measurement
is a flash test measurement. The procedure is compared to the translation
procedure as described in IEC standard 891. This procedure has a draw
backs that an estimate for the series resistance is required and that
the translation introduces deviations from the diode curve model.
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