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ECN publicatie:
Mapping of contact resistance and locating shunts on solar cells using resistance anaysis by mapping of potential (RAMP) techniques
Gepubliceerd door: Publicatie datum:
ECN Zonne-energie 1-5-2000
ECN publicatienummer: Publicatie type:
ECN-RX--00-014 Conferentiebijdrage
Aantal pagina's: Volledige tekst:
4 Download PDF  (1140kB)

Gepresenteerd op: 16th European Photovoltaic Solar Energy Conference and Exhibition, Glasgow, Scotland, 1-5 mei 2000.

Two new techniques are described, one to locate shunts on solar cells(PRAMP) and one to map the specific contact resistance rc of the front side metallisation (SCRAMP). In addition, the influence of a varying #rho#c on the diode factor n and the series resistance of a cell was calculated. The new techniques are both based on the mapping of a current induced potential to analyse the resistance problems. The PRAMP scan proved to be an easy technique to detect shunts with a resolution of

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